1912746

IEEE 660-1986 [ Withdrawn ]

IEEE Standard for Semiconductor Memory Test Pattern Language

standard by IEEE , 02/18/1986

View all product details

Most Recent

Track It

Language:
    • Available Formats
    • Options
    • Availability
    • Priced From ( in USD )
    • PDF
    • 👥
    • Immediate download
    • $56.00
      Members pay $45.00
    • Add to Cart

Customers Who Bought This Also Bought

 

About This Item

 

Full Description

Scope

The scope of this standard is the definition of a descriptive language, including vocabulary and grammar, to describe functional test sequences (also called patterns) for memory devices.

Purpose

The purpose of this standard is to establish a common language for describing functional tests of memory devices. That language definition includes the vocabulary and grammar necessary to specify the functional testing of memory devices. The language is intended to be used as a general descriptive language rather than one for programming a tester. As a result, the grammar and syntax are defined in a looser and more general way than would be required for a programming language. Rigorous Backus-Naur Form (BNF) descriptions are not included.

Abstract

New IEEE Standard - Inactive-Withdrawn.
 

Product Details

Published:
02/18/1986
ISBN(s):
9781504404129
Number of Pages:
14
File Size:
1 file , 3.3 MB
Product Code(s):
STDWD10413
Note:
This product is unavailable in Russia, Belarus