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About This Item

 

Full Description

Revision Standard - Superseded. Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards.
 

Document History

  1. IEEE 1149.1-2013


    IEEE Standard for Test Access Port and Boundary-Scan Architecture

    • Most Recent
  2. IEEE 1149.1-2001


    IEEE Standard Test Access Port and Boundary Scan Architecture

    • Historical Version
  3. IEEE 1149.1-1990

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    IEEE Standard Test Access Port and Boundary-Scan Architecture

    • Historical Version
 

Amendments, rulings, supplements, and errata

  1. IEEE 1149.1b-1994


    IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)