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IEEE 1445-1998

IEEE Standard for Digital Test Interchange Format (DTIF)

standard by IEEE , 03/10/1999

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Full Description

Scope

This standard will define the test program set data embodied in a number of ASCII files for stimulus, response, and diagnostics of digital systems for use on digital Automatic Test Systems.

Purpose

This standard will develop a definition of digital test information for digital test systems to cover UUT Model, stimulus/response, fault dictionary, probe data, and other forms of data. Any existing defacto standards will be given precedence.

Abstract

New IEEE Standard - Superseded. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are deÞned. This information can be broadly grouped into data that deÞnes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.
 

Product Details

Published:
03/10/1999
ISBN(s):
0738115533, 9780738115542
Number of Pages:
108
File Size:
1 file , 890 KB
Product Code(s):
STDSU94715
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This product is unavailable in Russia, Belarus
 

Document History

  1. IEEE 1445-2016


    IEEE Standard for Digital Test Interchange Format (DTIF)

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    IEEE Standard for Digital Test Interchange Format (DTIF)

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